Andriyani, Dina (2018) Karakterisasi Perilaku Radar Absorbansi Material (RAM) Berbasis BAM & PANI Dengan Struktur Geometri Multilayer Untuk Rentang Penyerapan X-Band. Undergraduate thesis, Institut Teknologi Sepuluh Nopember.
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Abstract
Karakterisasi perilaku pada material penyerap radar yang
terdiri dari Polianilin (PaNi) dan Barium M-Heksaferrit (BaM)
telah berhasil disintesis dengan metode solid state. Material
konduktif polianilin disintesis menggunakan metode polimerisasi
dengan dopan DBSA. Material RAM dikarakterisasi melalui XRay
Flourescence (XRF), X-Ray Diffraction (XRD), Fourier
Transform Infrared (FTIR), Four Point Probe (FPP), Scanning
Electron Microscope (SEM) dan Vector Network Analyzer (VNA).
Pendopingan ion Zn2+terhadap struktur BaM telah dilakukan,
dimana ion Zn2+ menggantikan ion Fe2+ pada barium Hexaferrit
sehingga fasa menjadi softmagnet. Campuran antara material
RAM dan cat termasuk dalam komposit dimana material RAM
sebagai filler dan cat sebagai binder/matrik. RAM tersebut akan
dilapiskan pada plat baja grade A tipe AH36 dengan metode
pelapisan Dallenbach multilayer dengan variasi ketebalan yaitu
2.4mm , 3.6mm , 4.8 mm dan 6 mm. Penyerapan gelombang
mikro diidentifikasi dengan pengujian VNA dan didapatkan
bahwa nilai rugi refleksi maksimum terdapat pada ketebalan
6mm dengan nilai rugi refleksi -32.6 dB pada frekuensi 8.4 GHz.
Nilai rugi refleksi variasi multilayer 2.4 mm, 3.6mm dan 4.8mm
berturut-turut yaitu -8.02 dB, -19.13 dB dan -28.9 dB pada
rentang frekuensi x band.
Kata kunci : BaM, Multilayer, Polianilin, RAM, Reflection Loss
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Characterization of behavior on radar absorbent
material consisting of Polianiline (PaNi) and Barium MHexaferrit
(BaM) has been successfully synthesized by solid state
method. Polyaniline conductive materials are synthesized using
polymerization methods with DBSA dopants. RAM materials are
characterized by X-Ray Flourescence (XRF), X-Ray Diffraction
(XRD), Fourier Transform Infrared (FTIR), Four Point Probe
(FPP), Scanning Electron Microscope (SEM) and Vector Network
Analyzer (VNA). Zn2+ ionization of the BaM structure has been
performed, in which the Zn2 + ion displaces the Fe2 + ion in the
Hexaferrit barium so that the phase becomes softmagnet. A
mixture of RAM and paint materials is included in the composite
where the RAM material as filler and paint as a binder / matrix.
RAM will be superimposed on AH36 grade A type steel plate with
multilayer Dallenbach coating method with thickness variation of
2.4mm, 3.6mm, 4.8mm and 6mm. Microwave absorption was
identified by VNA testing and it was found that the maximum
reflection loss value was at 6mm thick with a reflection value of
-32.6 dB at 8.4 GHz frequency. The reflection loss values of
multilayer variations are 2.4 mm, 3.6mm and 4.8mm respectively
-8.02 dB, -19.13 dB and -28.9 dB in the x band frequency range.
Keywords : BaM, Multilayer, Polianilin, RAM, Reflection Loss
| Item Type: | Thesis (Undergraduate) |
|---|---|
| Additional Information: | RSFi 537.015 1 And k-1 3100018076893 |
| Uncontrolled Keywords: | BaM, Multilayer, Polianilin, RAM, Reflection Loss |
| Subjects: | Q Science Q Science > QC Physics > QC162 Adsorption and absorption U Military Science > U Military Science (General) |
| Divisions: | Faculty of Natural Science > Physics > 45201-(S1) Undergraduate Thesis |
| Depositing User: | Dina Andriyani |
| Date Deposited: | 15 Jul 2021 04:03 |
| Last Modified: | 15 Jul 2021 04:08 |
| URI: | http://repository.its.ac.id/id/eprint/53539 |
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