Dwianto, Kresna Bayu (2019) Pengaruh Waktu Anil Pada Sifat Optik Lapisan Terkait Ukuran Film TiO2 Sebagai Material Pendukung Sel Surya Berbasis Perovskite. Other thesis, Institut Teknologi Sepuluh Nopember.
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Abstract
Penelitian yang berjudul “pengaruh waktu anil pada sifat optic lapisan terkait ukuran film TiO2 sebagai material pendukung sel surya berbasis perovskite” bertujuan untuk mengetahui pengaruh waktu anil terhadap sifat dari lapisan tipis TiO2 berupa energy gap, absorbansi, ketebalan lapisan tipis, koefisien absorpsi fasa dan ukuran kristal serta senyawa yang terbentuk pada lapisan tipis TiO2. Sampel dibuat dengan mencampurkan toluena, TiCl3 dan 2-propanol kemudian di sintesis diatas substrat kaca ITO dengan metode Spin-Coating selama 1 menit dengan kecepatan 1000 rpm. Setelah lapisan tipis terbentuk dilakukan anil pada suhu 500°C dengan variasi waktu holding 30 menit, 60 menit, 90 menit dan 120 menit. Kemudian dikarakterisasi menggunakan UV-Vis, XRD dan FTIR. Dari karakterisasi UV-Vis didapatkan nilai ketebalan lapisan tipis TiO2 pada sampel T0A, T30C, T60A, T90B, dan T120B secara berturut-turut sebesar 1187 nm, 2052 nm, 570 nm, 1780 nm, dan 649 nm. Untuk energy gap, didapatkan hasil pada sampel T30C, T60A, T90B, dan T120B berturut-turut sebesar 2,85 eV, 3,13 eV, 2,76 eV, dan 2,82 eV. Dari hasil XRD didapatkan puncak anatase teramati pada sudut 23°, 36° dan 49° dan puncak tertinggi terdapat pada sudut 30° yang teridentifikasi sebagai puncak rutil. Ukuran kristal paling besar terdapat pada sampel T30C dan yang paling kecil pada sampel T60A. Hasil karakterisasi FTIR menunjukkan terdapat absorpsi O-Ti-O pada bilangan gelombang 567,54 cm-1 yang menandakan terbentuknya senyawa TiO2. =====================================================================================================================================
The research entitled "the effect of annealing time on the optical properties of layers related to TiO2 film size as perovskitebased solar cell support material" aims to determine the effect of annealing time on the properties of TiO2 thin layers in the form of energy gap, absorbance, thin layer thickness, phase absorption coefficient and size crystals and compounds formed in thin layers of TiO2. The sample was made by mixing toluene, TiCl3 and 2propanol and then synthesizing it on the ITO glass substrate with the Spin-Coating method for 1 minute at a speed of 1000 rpm. After the thin layer was formed annealing was carried out at 500 ° C with a variation of 30 minutes holding time, 60 minutes, 90 minutes and 120 minutes. Then it was characterized using UVVis, XRD and FTIR. From the UV-Vis characterization, the thickness of the TiO2 thin layer found in samples T0A, T30C, T60A, T90B, and T120B were 1187 nm, 2052 nm, 570 nm, 1780 nm, and 649 nm respectively. For the energy gap, the results obtained in the samples T30C, T60A, T90B, and T120B are 2,85 eV, 3,13 eV, 2,76 eV, and 2,82 eV, respectively. From the results of XRD the anatase peak was observed at an angle of 23°, 36° and 49° and the highest peak was at an angle of 30° which was identified as a rutile peak. The largest crystal size is found in the T30C sample and the smallest in the T60A sample. The results of FTIR characterization showed that there was absorption of O-TiO at wave number 567,54 cm-1 which indicates the formation of TiO2 compounds.
| Item Type: | Thesis (Other) |
|---|---|
| Additional Information: | RSFi 530.427 5 Dwi p-1 |
| Uncontrolled Keywords: | Absorpsi, Energi Gap, Lapisan Tipis TiO2, Sel Surya |
| Subjects: | Q Science Q Science > QC Physics |
| Divisions: | Faculty of Natural Science > Physics > 45201-(S1) Undergraduate Thesis |
| Depositing User: | Kresna Bayu Dwianto |
| Date Deposited: | 25 Mar 2025 03:01 |
| Last Modified: | 25 Mar 2025 03:01 |
| URI: | http://repository.its.ac.id/id/eprint/65410 |
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