Primadani, Dimas Ayu (2019) Analisis Struktur dan Kemampuan Penyerapan Gelombang Elektromagnetik Rentang X-band oleh Material Penyerap Radar Barium M-Heksaferit Terdoping Ion Zn dan Polianilin dengan Variasi Ketebalan. Other thesis, Institut Teknologi Sepuluh Nopember.
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Abstract
Desain pelapisan double layer dengan variasi ketebalan lapisan 1 mm, 2 mm, 3 mm, dan 4 mm pada material penyerap radar (RAM), dengan Barium M-Heksaferit (BaM) sebagai material magnetik dengan variasi konsentrasi doping ion Zn2+ x=0,3 dan 0,9 telah berhasil disintesis dengan metode solid state reaction. Begitu juga dengan Polianilin (PANi) dengan dopan DBSA sebagai material konduktif, telah berhasil disintesis dengan metode polimerisas. Material penyerap radar (RAM) dikarakterisasi dengan menggunakan X-Ray Flourescence (XRF), X-Ray Diffraction (XRD), Fourier Transform Infrared (FTIR), Four Point Probe (FPP), Scanning Electron Microscope (SEM) dan Vector Network Analyzer (VNA). Hasil karakterisasi XRD menunjukkan bahwa fasa primer terbesar diperoleh pada BaM x 0,9 yaitu 96,56%. Selain itu, berdasarkan penelitian dan pengujian, diketahui bahwa variasi ketebalan lapisan dan konsentrasi doping ion Zn2+ dapat meningkatan nilai rugi refleksi dan pelebaran pita penyerapan rentang X-Band (8-12 GHz). Rugi refleksi dan pelebaran pita serapan terbesar diperoleh dari pelapisan BaM x 0,9 dengan ketebalan 4 mm yaitu secara berturut-turut sebesar - 16,29 dB, dan 3,78 dB. Sehingga dapat disimpulkan bahwa penambahan konsentrasi doping ion Zn2+ dan dimensi ketebalan lapisan dapat meningkatkan kemampuan penyerapan material RAM.
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Double layer coating design with thickness variations of 1 mm, 2 mm, 3 mm, and 4 mm on radar absorbent material (RAM), with Barium M-Hexaferrite (BaM) as magnetic material with variations of Zn2+ ion doping concentration of x = 0.3 ion and 0.9 have been successfully synthesized by solid state reaction method. Moreover, Polyaniline (PANi) with DBSA dopant as a conductive material also has been successfully synthesized by polymerization method. Radar absorbing materials (RAM) are characterized using X-Ray Flourescence (XRF), X- Ray Diffraction (XRD), Fourier Transform Infrared (FTIR), Four Point Probes (FPP), Scanning Electron Microscope (SEM) and Vector Network Analyzer (VNA). The results of XRD characterization show that the maximum primary phase that is 96,56% obtained at BaM x 0,9. In addition, based on the research and testing, it was known that variations of thickness and Zn2+ ion doping concentration can increase the reflection loss and absorption bandwith in X-Band range (8-12 GHz). The reflection loss and absorption bandwith maximum are obtained from coating BaM x 0.9 with a thickness of 4 mm which is respectively -
16.29 dB and 3.78 dB. So, it can be concluded that the addition of Zn2+ ion doping concentration and the thickness of layer dimensions can improve the absorption ability of RAM material.
| Item Type: | Thesis (Other) |
|---|---|
| Additional Information: | RSFi 539.2 Pri a-1 2019 |
| Uncontrolled Keywords: | Barium M-Heksaferit, Doping, Konsentrasi, Ketebalan, Polianilin, Rugi Refleksi |
| Subjects: | Q Science > QC Physics Q Science > QC Physics > QC162 Adsorption and absorption Q Science > QC Physics > QC173.4.C63 Composite materials Q Science > QC Physics > QC610.3 Electric conductivity Q Science > QC Physics > QC765 Magnetic materials |
| Divisions: | Faculty of Natural Science > Physics > 45201-(S1) Undergraduate Thesis |
| Depositing User: | Dimas Ayu Primadani |
| Date Deposited: | 24 May 2023 03:18 |
| Last Modified: | 24 May 2023 03:18 |
| URI: | http://repository.its.ac.id/id/eprint/64489 |
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